Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences

B. Li, N. Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectronics Reliability, 51(9-11):1557-1560, 2011. [doi]

Abstract

Abstract is missing.