B. Li, N. Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectronics Reliability, 51(9-11):1557-1560, 2011. [doi]
@article{LiBBBF11,
title = {Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences},
author = {B. Li and N. Berbel and Alexandre Boyer and Sonia Bendhia and Raúl Fernández-García},
year = {2011},
doi = {10.1016/j.microrel.2011.06.010},
url = {http://dx.doi.org/10.1016/j.microrel.2011.06.010},
researchr = {https://researchr.org/publication/LiBBBF11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1557-1560},
}