A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O

Yan Li, Steven Bielby, Azhar A. Chowdhury, Gordon W. Roberts. A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O. J. Electronic Testing, 32(4):423-436, 2016. [doi]

Authors

Yan Li

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Steven Bielby

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Azhar A. Chowdhury

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Gordon W. Roberts

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