Yan Li, Steven Bielby, Azhar A. Chowdhury, Gordon W. Roberts. A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O. J. Electronic Testing, 32(4):423-436, 2016. [doi]
@article{LiBCR16,
title = {A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O},
author = {Yan Li and Steven Bielby and Azhar A. Chowdhury and Gordon W. Roberts},
year = {2016},
doi = {10.1007/s10836-016-5604-2},
url = {http://dx.doi.org/10.1007/s10836-016-5604-2},
researchr = {https://researchr.org/publication/LiBCR16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {4},
pages = {423-436},
}