Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage Bias Technique - researchr publication authors

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Tianjian Li, Xiangyu Bi, Naifeng Jing, Xiaoyao Liang, Li Jiang. Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage Bias Technique. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]

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