Tianjian Li, Xiangyu Bi, Naifeng Jing, Xiaoyao Liang, Li Jiang. Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage Bias Technique. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]
@inproceedings{LiBJLJ17,
title = {Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage Bias Technique},
author = {Tianjian Li and Xiangyu Bi and Naifeng Jing and Xiaoyao Liang and Li Jiang},
year = {2017},
doi = {10.1145/3061639.3062318},
url = {http://doi.acm.org/10.1145/3061639.3062318},
researchr = {https://researchr.org/publication/LiBJLJ17},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017},
publisher = {ACM},
isbn = {978-1-4503-4927-7},
}