A Lightweight Fully Convolutional Neural Network of High Accuracy Surface Defect Detection - researchr publication authors

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Yajie Li, Yiqiang Chen, Yang Gu, Jianquan Ouyang, Jiwei Wang, Ni Zeng. A Lightweight Fully Convolutional Neural Network of High Accuracy Surface Defect Detection. In Igor Farkas, Paolo Masulli, Stefan Wermter, editors, Artificial Neural Networks and Machine Learning - ICANN 2020 - 29th International Conference on Artificial Neural Networks, Bratislava, Slovakia, September 15-18, 2020, Proceedings, Part II. Volume 12397 of Lecture Notes in Computer Science, pages 15-26, Springer, 2020. [doi]

This author has not been identified. Look up 'Yajie Li' in GoogleThis author has not been identified. Look up 'Yiqiang Chen' in GoogleThis author has not been identified. Look up 'Yang Gu' in GoogleThis author has not been identified. Look up 'Jianquan Ouyang' in GoogleThis author has not been identified. Look up 'Jiwei Wang' in GoogleThis author has not been identified. Look up 'Ni Zeng' in Google

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