Yajie Li, Yiqiang Chen, Yang Gu, Jianquan Ouyang, Jiwei Wang, Ni Zeng. A Lightweight Fully Convolutional Neural Network of High Accuracy Surface Defect Detection. In Igor Farkas, Paolo Masulli, Stefan Wermter, editors, Artificial Neural Networks and Machine Learning - ICANN 2020 - 29th International Conference on Artificial Neural Networks, Bratislava, Slovakia, September 15-18, 2020, Proceedings, Part II. Volume 12397 of Lecture Notes in Computer Science, pages 15-26, Springer, 2020. [doi]
@inproceedings{LiCGOWZ20,
title = {A Lightweight Fully Convolutional Neural Network of High Accuracy Surface Defect Detection},
author = {Yajie Li and Yiqiang Chen and Yang Gu and Jianquan Ouyang and Jiwei Wang and Ni Zeng},
year = {2020},
doi = {10.1007/978-3-030-61616-8_2},
url = {https://doi.org/10.1007/978-3-030-61616-8_2},
researchr = {https://researchr.org/publication/LiCGOWZ20},
cites = {0},
citedby = {0},
pages = {15-26},
booktitle = {Artificial Neural Networks and Machine Learning - ICANN 2020 - 29th International Conference on Artificial Neural Networks, Bratislava, Slovakia, September 15-18, 2020, Proceedings, Part II},
editor = {Igor Farkas and Paolo Masulli and Stefan Wermter},
volume = {12397},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-61616-8},
}