Yajie Li, Yiqiang Chen, Yang Gu, Jianquan Ouyang, Jiwei Wang, Ni Zeng. A Lightweight Fully Convolutional Neural Network of High Accuracy Surface Defect Detection. In Igor Farkas, Paolo Masulli, Stefan Wermter, editors, Artificial Neural Networks and Machine Learning - ICANN 2020 - 29th International Conference on Artificial Neural Networks, Bratislava, Slovakia, September 15-18, 2020, Proceedings, Part II. Volume 12397 of Lecture Notes in Computer Science, pages 15-26, Springer, 2020. [doi]
Abstract is missing.