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Improving scratch-pad memory reliability through compiler-guided data block duplication

Feihui Li, Guilin Chen, Mahmut T. Kandemir, Ibrahim Kolcu. Improving scratch-pad memory reliability through compiler-guided data block duplication. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 1002-1005, IEEE Computer Society, 2005.

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Feihui Li

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Guilin Chen

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Mahmut T. Kandemir

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Ibrahim Kolcu

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