Feihui Li, Guilin Chen, Mahmut T. Kandemir, Ibrahim Kolcu. Improving scratch-pad memory reliability through compiler-guided data block duplication. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 1002-1005, IEEE Computer Society, 2005.
@inproceedings{LiCKK05:0,
title = {Improving scratch-pad memory reliability through compiler-guided data block duplication},
author = {Feihui Li and Guilin Chen and Mahmut T. Kandemir and Ibrahim Kolcu},
year = {2005},
tags = {compiler, reliability},
researchr = {https://researchr.org/publication/LiCKK05%3A0},
cites = {0},
citedby = {0},
pages = {1002-1005},
booktitle = {2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-9254-X},
}