Fault modeling and testing of resistive nonvolatile-8T SRAMs

Yu-Ting Li, Yong-Xiao Chen, Jin-Fu Li. Fault modeling and testing of resistive nonvolatile-8T SRAMs. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]

Abstract

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