A carbon emission analysis model for electronics manufacturing process based on value-stream mapping and sensitivity analysis

Hongcheng Li, Huajun Cao, Xiaoyong Pan. A carbon emission analysis model for electronics manufacturing process based on value-stream mapping and sensitivity analysis. Int. J. Computer Integrated Manufacturing, 25(12):1102-1110, 2012. [doi]

Authors

Hongcheng Li

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Huajun Cao

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Xiaoyong Pan

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