A carbon emission analysis model for electronics manufacturing process based on value-stream mapping and sensitivity analysis

Hongcheng Li, Huajun Cao, Xiaoyong Pan. A carbon emission analysis model for electronics manufacturing process based on value-stream mapping and sensitivity analysis. Int. J. Computer Integrated Manufacturing, 25(12):1102-1110, 2012. [doi]

@article{LiCP12,
  title = {A carbon emission analysis model for electronics manufacturing process based on value-stream mapping and sensitivity analysis},
  author = {Hongcheng Li and Huajun Cao and Xiaoyong Pan},
  year = {2012},
  doi = {10.1080/0951192X.2012.684715},
  url = {http://dx.doi.org/10.1080/0951192X.2012.684715},
  researchr = {https://researchr.org/publication/LiCP12},
  cites = {0},
  citedby = {0},
  journal = {Int. J. Computer Integrated Manufacturing},
  volume = {25},
  number = {12},
  pages = {1102-1110},
}