Automatic circuit adjustment technique for process sensitivity reduction and yield improvement

Hsiu-Wen Li, Ren-Hong Fu, Hsin-Yu Luo, Chien-Nan Jimmy Liu. Automatic circuit adjustment technique for process sensitivity reduction and yield improvement. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 2582-2585, IEEE, 2010. [doi]

@inproceedings{LiFLL10,
  title = {Automatic circuit adjustment technique for process sensitivity reduction and yield improvement},
  author = {Hsiu-Wen Li and Ren-Hong Fu and Hsin-Yu Luo and Chien-Nan Jimmy Liu},
  year = {2010},
  doi = {10.1109/ISCAS.2010.5537103},
  url = {http://dx.doi.org/10.1109/ISCAS.2010.5537103},
  researchr = {https://researchr.org/publication/LiFLL10},
  cites = {0},
  citedby = {0},
  pages = {2582-2585},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France},
  publisher = {IEEE},
}