Automatic circuit adjustment technique for process sensitivity reduction and yield improvement

Hsiu-Wen Li, Ren-Hong Fu, Hsin-Yu Luo, Chien-Nan Jimmy Liu. Automatic circuit adjustment technique for process sensitivity reduction and yield improvement. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 2582-2585, IEEE, 2010. [doi]

Abstract

Abstract is missing.