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Ping-Chung Li, Ibrahim N. Hajj. Computer-aided redesign of VLSI circuits for hot-carrier reliability. IEEE Trans. on CAD of Integrated Circuits and Systems, 15(5):453-464, 1996. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Computer-Aided Redesign of VLSI Circuits for Hot-Carrier ReliabilityPing-Chung Li, Ibrahim N. Hajj. iccd 1993: 534-537 Probabilistic simulation for reliability analysis of CMOS VLSI circuitsFarid N. Najm, Richard Burch, Ping Yang, Ibrahim N. Hajj. tcad, 9(4):439-450, 1990. [doi]
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