Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin. A Hierarchical Test Scheme for System-On-Chip Designs. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 486-490, IEEE Computer Society, 2002. [doi]
@inproceedings{LiHCSWCCHL02:0,
title = {A Hierarchical Test Scheme for System-On-Chip Designs},
author = {Jin-Fu Li and Hsin-Jung Huang and Jeng-Bin Chen and Chih-Pin Su and Cheng-Wen Wu and Chuang Cheng and Shao-I Chen and Chi-Yi Hwang and Hsiao-Ping Lin},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/date/2002/1471/00/14710486abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/LiHCSWCCHL02%3A0},
cites = {0},
citedby = {0},
pages = {486-490},
booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1471-5},
}