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Improving MC/DC and Fault Detection Strength Using Combinatorial Testing

Dong Li, Linghuan Hu, Ruizhi Gao, W. Eric Wong, D. Richard Kuhn, Raghu N. Kacker. Improving MC/DC and Fault Detection Strength Using Combinatorial Testing. In 2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017. pages 297-303, IEEE, 2017. [doi]

Authors

Dong Li

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Linghuan Hu

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Ruizhi Gao

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W. Eric Wong

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D. Richard Kuhn

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Raghu N. Kacker

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