Dong Li, Linghuan Hu, Ruizhi Gao, W. Eric Wong, D. Richard Kuhn, Raghu N. Kacker. Improving MC/DC and Fault Detection Strength Using Combinatorial Testing. In 2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017. pages 297-303, IEEE, 2017. [doi]
Abstract is missing.