Dong Li, Linghuan Hu, Ruizhi Gao, W. Eric Wong, D. Richard Kuhn, Raghu N. Kacker. Improving MC/DC and Fault Detection Strength Using Combinatorial Testing. In 2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017. pages 297-303, IEEE, 2017. [doi]
@inproceedings{LiHGWKK17,
title = {Improving MC/DC and Fault Detection Strength Using Combinatorial Testing},
author = {Dong Li and Linghuan Hu and Ruizhi Gao and W. Eric Wong and D. Richard Kuhn and Raghu N. Kacker},
year = {2017},
doi = {10.1109/QRS-C.2017.131},
url = {https://doi.org/10.1109/QRS-C.2017.131},
researchr = {https://researchr.org/publication/LiHGWKK17},
cites = {0},
citedby = {0},
pages = {297-303},
booktitle = {2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017},
publisher = {IEEE},
isbn = {978-1-5386-2072-4},
}