Deterministic and low power BIST based on scan slice overlapping

Ji Li, Yinhe Han, Xiaowei Li. Deterministic and low power BIST based on scan slice overlapping. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 5670-5673, IEEE, 2005. [doi]

Abstract

Abstract is missing.