Tianjian Li, Yan Han, Xiaoyao Liang, Hsien-Hsin S. Lee, Li Jiang. Fault clustering technique for 3D memory BISR. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 560-565, IEEE, 2017. [doi]
Abstract is missing.