Bo Li 0051, Yunbo Huang, Ling Yang, Qingzhu Zhang, Zhongshan Zheng, Binhong Li, Huiping Zhu, J. H. Bu, Huaxiang Yin, Jiajun Luo, Zhengsheng Han, Haibin Wang. Process variation dependence of total ionizing dose effects in bulk nFinFETs. Microelectronics Reliability, 88:946-951, 2018. [doi]
Abstract is missing.