Ming Li, Wen-Ben Jone, Qing-An Zeng. An Efficient Wrapper Scan Chain Configuration Method for Network-on-Chip Testing. In 2006 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2006), 2-3 March 2006, Karlsruhe, Germany. pages 147-152, IEEE Computer Society, 2006. [doi]
Abstract is missing.