Feihui Li, Mahmut T. Kandemir. Increasing Data TLB Resilience to Transient Errors. In 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), New Frontiers in VLSI Design, 11-12 May 2005, Tampa, FL, USA. pages 297-298, IEEE Computer Society, 2005. [doi]
Abstract is missing.