Design for testability (DFT) for RSFQ circuits

Mingye Li, Yunkun Lin, Sandeep Gupta. Design for testability (DFT) for RSFQ circuits. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-7, IEEE, 2023. [doi]

Abstract

Abstract is missing.