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M. Y. Li, J. P. Lee, C.-H. Liu, J.-C. Guo, Steve S. Chung. 8 Endurance and Excellent Retention. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.