A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI - researchr publication authors

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Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen. A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 145-150, IEEE Computer Society, 2004. [doi]

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