Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen. A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 145-150, IEEE Computer Society, 2004. [doi]
@inproceedings{LiLSC04,
title = {A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI},
author = {Katherine Shu-Min Li and Chung-Len Lee and Chauchin Su and Jwu E. Chen},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350145abs.htm},
tags = {e-science, systematic-approach},
researchr = {https://researchr.org/publication/LiLSC04},
cites = {0},
citedby = {0},
pages = {145-150},
booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2235-1},
}