Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen. Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electronic Testing, 31(5-6):561-568, 2015. [doi]
@article{LiLWLWNMC15,
title = {Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology},
author = {Lixiang Li and Yuanqing Li and Haibin Wang and Rui Liu and Qiong Wu and Michael Newton and Yuan Ma and Li Chen},
year = {2015},
doi = {10.1007/s10836-015-5549-x},
url = {http://dx.doi.org/10.1007/s10836-015-5549-x},
researchr = {https://researchr.org/publication/LiLWLWNMC15},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {31},
number = {5-6},
pages = {561-568},
}