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Analyzing the synergistic effect of ionization and displacement damage in carbon nanotube field-effect transistors using protons irradiation

Yichen Li, Peng Lu, Zhongshan Zheng, Dong Zhang, Can Yang, Xiaojing Li, Yichao Sun, Bo Li. Analyzing the synergistic effect of ionization and displacement damage in carbon nanotube field-effect transistors using protons irradiation. IEICE Electronic Express, 22(14):20240573, 2025. [doi]

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