A Method for Improving Power Grid Resilience to Electromigration-Caused via Failures

Di-an Li, Malgorzata Marek-Sadowska, Sani R. Nassif. A Method for Improving Power Grid Resilience to Electromigration-Caused via Failures. IEEE Trans. VLSI Syst., 23(1):118-130, 2015. [doi]

Abstract

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