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Thermally-induced soft errors in nanoscale CMOS circuits

Hua Li, Joseph L. Mundy, William R. Patterson, Dimitrios Kazazis, Alexander Zaslavsky, R. Iris Bahar. Thermally-induced soft errors in nanoscale CMOS circuits. In 2007 IEEE International Symposium on Nanoscale Architectures, NANOARCH 2007, San Jose, CA, USA, October 21-22, 2007. pages 62-69, IEEE Computer Society, 2007. [doi]

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