Hua Li, Joseph L. Mundy, William R. Patterson, Dimitrios Kazazis, Alexander Zaslavsky, R. Iris Bahar. Thermally-induced soft errors in nanoscale CMOS circuits. In 2007 IEEE International Symposium on Nanoscale Architectures, NANOARCH 2007, San Jose, CA, USA, October 21-22, 2007. pages 62-69, IEEE Computer Society, 2007. [doi]
@inproceedings{LiMPKZB07,
title = {Thermally-induced soft errors in nanoscale CMOS circuits},
author = {Hua Li and Joseph L. Mundy and William R. Patterson and Dimitrios Kazazis and Alexander Zaslavsky and R. Iris Bahar},
year = {2007},
url = {http://dl.acm.org/citation.cfm?id=1548936},
researchr = {https://researchr.org/publication/LiMPKZB07},
cites = {0},
citedby = {0},
pages = {62-69},
booktitle = {2007 IEEE International Symposium on Nanoscale Architectures, NANOARCH 2007, San Jose, CA, USA, October 21-22, 2007},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-1791-9},
}