Kexin Li, Takashi Matsuda, Eiji Yagyu, Koon Hoo Teo, Shaloo Rakheja. Trapping Phenomena in GaN HEMTs with Fe- and C-doped Buffer. In Device Research Conference, DRC 2022, Columbus, OH, USA, June 26-29, 2022. pages 1-2, IEEE, 2022. [doi]
Abstract is missing.