Haocheng Li, Satwik Patnaik, Mohammed Ashraf, Haoyu Yang, Johann Knechtel, Bei Yu 0001, Ozgur Sinanoglu, Evangeline F. Y. Young. Deep Learning Analysis for Split-Manufactured Layouts With Routing Perturbation. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):1995-2008, 2021. [doi]
@article{LiPAYKYSY21,
title = {Deep Learning Analysis for Split-Manufactured Layouts With Routing Perturbation},
author = {Haocheng Li and Satwik Patnaik and Mohammed Ashraf and Haoyu Yang and Johann Knechtel and Bei Yu 0001 and Ozgur Sinanoglu and Evangeline F. Y. Young},
year = {2021},
doi = {10.1109/TCAD.2020.3037297},
url = {https://doi.org/10.1109/TCAD.2020.3037297},
researchr = {https://researchr.org/publication/LiPAYKYSY21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {40},
number = {10},
pages = {1995-2008},
}