Haocheng Li, Satwik Patnaik, Mohammed Ashraf, Haoyu Yang, Johann Knechtel, Bei Yu 0001, Ozgur Sinanoglu, Evangeline F. Y. Young. Deep Learning Analysis for Split-Manufactured Layouts With Routing Perturbation. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(10):1995-2008, 2021. [doi]
Abstract is missing.