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Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits

Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton. Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 433-440, IEEE, 2009. [doi]

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Xin Li

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Rob A. Rutenbar

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R. D. (Shawn) Blanton

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