Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton. Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 433-440, IEEE, 2009. [doi]
@inproceedings{LiRB09,
title = {Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits},
author = {Xin Li and Rob A. Rutenbar and R. D. (Shawn) Blanton},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5361258},
researchr = {https://researchr.org/publication/LiRB09},
cites = {0},
citedby = {0},
pages = {433-440},
booktitle = {2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA},
publisher = {IEEE},
}