Trace-based microarchitecture-level diagnosis of permanent hardware faults - researchr publication authors

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Man-Lap Li, Pradeep Ramachandran, Swarup Kumar Sahoo, Sarita V. Adve, Vikram S. Adve, Yuanyuan Zhou. Trace-based microarchitecture-level diagnosis of permanent hardware faults. In The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings. pages 22-31, IEEE Computer Society, 2008. [doi]

This author has not been identified. Look up 'Man-Lap Li' in GoogleThis author has not been identified. Look up 'Pradeep Ramachandran' in GoogleThis author has not been identified. Look up 'Swarup Kumar Sahoo' in GoogleThis author has not been identified. Look up 'Sarita V. Adve' in GoogleThis author has not been identified. Look up 'Vikram S. Adve' in GoogleThis author has not been identified. Look up 'Yuanyuan Zhou' in Google

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