Man-Lap Li, Pradeep Ramachandran, Swarup Kumar Sahoo, Sarita V. Adve, Vikram S. Adve, Yuanyuan Zhou. Trace-based microarchitecture-level diagnosis of permanent hardware faults. In The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings. pages 22-31, IEEE Computer Society, 2008. [doi]
@inproceedings{LiRSAAZ08,
title = {Trace-based microarchitecture-level diagnosis of permanent hardware faults},
author = {Man-Lap Li and Pradeep Ramachandran and Swarup Kumar Sahoo and Sarita V. Adve and Vikram S. Adve and Yuanyuan Zhou},
year = {2008},
doi = {10.1109/DSN.2008.4630067},
url = {http://dx.doi.org/10.1109/DSN.2008.4630067},
tags = {rule-based},
researchr = {https://researchr.org/publication/LiRSAAZ08},
cites = {0},
citedby = {0},
pages = {22-31},
booktitle = {The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings},
publisher = {IEEE Computer Society},
}