Gang Li, Haisheng San, Xuyuan Chen. Charge accumulation and their relaxation in SiO2 films containing silicon nanocrystals. In 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010. pages 736-739, IEEE, 2010. [doi]
Abstract is missing.