Lushan Liu, Ramalingam Sridhar, Shambhu J. Upadhyaya. A 3-port Register File Design for Improved Fault Tolerance on Resistive Defects in Core-Cells. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 545-553, IEEE Computer Society, 2006. [doi]
Abstract is missing.