Dielectric tunnel parameters of CoFe/Al-O/CoFe in MTJ for 1T1MTJ MRAM applications - researchr publication authors

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Simon C. Li, J. P. Su, T. H. Wu, J. M. Lee, M. F. Shu. Dielectric tunnel parameters of CoFe/Al-O/CoFe in MTJ for 1T1MTJ MRAM applications. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 29-34, IEEE Computer Society, 2005. [doi]

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