SmartInjector: Exploiting intelligent fault injection for SDC rate analysis - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jianli Li, Qingping Tan. SmartInjector: Exploiting intelligent fault injection for SDC rate analysis. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 236-242, IEEE, 2013. [doi]

This author has not been identified. Look up 'Jianli Li' in GoogleThis author has not been identified. Look up 'Qingping Tan' in Google

runs on WebDSL