Jianli Li, Qingping Tan. SmartInjector: Exploiting intelligent fault injection for SDC rate analysis. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 236-242, IEEE, 2013. [doi]
Abstract is missing.