Tong Li, Ching-Han Tsai, Sung-Mo Kang. Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress. In ICCAD. pages 6-11, 1998. [doi]
@inproceedings{LiTK98,
title = {Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress},
author = {Tong Li and Ching-Han Tsai and Sung-Mo Kang},
year = {1998},
doi = {10.1145/288548.288553},
url = {http://doi.acm.org/10.1145/288548.288553},
researchr = {https://researchr.org/publication/LiTK98},
cites = {0},
citedby = {0},
pages = {6-11},
booktitle = {ICCAD},
}