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Tong Li, Ching-Han Tsai, Sung-Mo Kang. Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress. In ICCAD. pages 6-11, 1998. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devicesCarlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury. tcad, 13(4):482-493, 1994. [doi] ETS-A: A New Electrothermal Simulator for CMOS VLSI CircuitsYi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang. date 1996: 566-570 [doi]
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