Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu. Testing and Diagnosing Embedded Content Addressable Memories. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 389-394, IEEE Computer Society, 2002. [doi]
Abstract is missing.